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dc.contributor.authorSchmid, Philipp A. E.
dc.date.accessioned2022-06-22T07:26:34Z
dc.date.available2022-06-22T07:26:34Z
dc.date.issued2022-06-15
dc.identifier.citationswissT.net Sektion 46 «Vision Systems»en_US
dc.identifier.urihttps://yoda.csem.ch/handle/20.500.12839/1028
dc.description.abstractDeep Learning für die Industrie - Qualitätskontrolle, Prozessoptimierung und Predictive Maintenanceen_US
dc.language.isodeen_US
dc.subjectDeep Learningen_US
dc.subjectPredictive Qualityen_US
dc.subjectPredictive Maintenanceen_US
dc.subjectQuality Inspectionen_US
dc.titleDeep Learning für die Industrie: Qualitätskontrolle, Prozessoptimierung und Predictive Maintenanceen_US
dc.typeConferenceen_US
dc.type.csemdivisionsDiv-Ren_US
dc.type.csemresearchareasIndustry 4.0en_US


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