Contact resistivity measurements and their applicability for accurate series resistance breakdown in heterojunction solar cell
dc.contributor.author | Antognini, L. | |
dc.contributor.author | Senaud, L. -L. | |
dc.contributor.author | Türkay, D. | |
dc.contributor.author | Marthey, L. | |
dc.contributor.author | Dréon, J. | |
dc.contributor.author | Paviet-Salomon, B. | |
dc.contributor.author | Ballif, C. | |
dc.date.accessioned | 2023-01-12T16:32:26Z | |
dc.date.available | 2023-01-12T16:32:26Z | |
dc.date.issued | 2022-08 | |
dc.identifier.citation | Paper presented at the AIP Conference Proceedings 2487 | |
dc.identifier.uri | https://yoda.csem.ch/handle/20.500.12839/1098 | |
dc.title | Contact resistivity measurements and their applicability for accurate series resistance breakdown in heterojunction solar cell | |
dc.type | Proceedings Article | |
dc.type.csemdivisions | Div-V | |
dc.type.csemresearchareas | PV & Solar Buildings | |
dc.identifier.doi | doi:10.1063/5.0090643 |
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