In situ reflectometry and diffraction investigation of the multiscale structure of p-type polysilicon passivating contacts for c-si solar cells

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Author
Morisset, A.; Famprikis, T.; Haug, F.-J.; Ingenito, A.; Ballif, C.; Bannenberg, L. J.
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Publication Reference
ACS Applied Materials and Interfaces, 14(14), 16413-16423
Year
2022-03
URI
https://yoda.csem.ch/handle/20.500.12839/1111
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