In situ reflectometry and diffraction investigation of the multiscale structure of p-type polysilicon passivating contacts for c-si solar cells
| dc.contributor.author | Morisset, A. | |
| dc.contributor.author | Famprikis, T. | |
| dc.contributor.author | Haug, F.-J. | |
| dc.contributor.author | Ingenito, A. | |
| dc.contributor.author | Ballif, C. | |
| dc.contributor.author | Bannenberg, L. J. | |
| dc.date.accessioned | 2023-01-12T16:32:27Z | |
| dc.date.available | 2023-01-12T16:32:27Z | |
| dc.date.issued | 2022-03 | |
| dc.identifier.citation | ACS Applied Materials and Interfaces, 14(14), 16413-16423 | |
| dc.identifier.uri | https://yoda.csem.ch/handle/20.500.12839/1111 | |
| dc.title | In situ reflectometry and diffraction investigation of the multiscale structure of p-type polysilicon passivating contacts for c-si solar cells | |
| dc.type | Journal Article | |
| dc.type.csemdivisions | Div-V | |
| dc.type.csemresearchareas | PV & Solar Buildings | |
| dc.identifier.doi | doi:10.1021/acsami.2c01225 |
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