Amorphous/Crystalline Silicon Interface Stability: Correlation between Infrared Spectroscopy and Electronic Passivation Properties
| dc.contributor.author | Holovsky, J. | |
| dc.contributor.author | De Nicolas, S. M. | |
| dc.contributor.author | De Wolf, S. | |
| dc.contributor.author | Ballif, C. | |
| dc.date.accessioned | 2021-12-13T16:35:46Z | |
| dc.date.available | 2021-12-13T16:35:46Z | |
| dc.date.issued | 2020-10 | |
| dc.identifier.citation | Advanced Materials Interfaces, vol. 7 (20), p. 7, Oct 2020. | |
| dc.identifier.uri | https://yoda.csem.ch/handle/20.500.12839/408 | |
| dc.title | Amorphous/Crystalline Silicon Interface Stability: Correlation between Infrared Spectroscopy and Electronic Passivation Properties | |
| dc.type | Journal Article | |
| dc.type.csemdivisions | Div-V | |
| dc.type.csemresearchareas | Energy Harvesting | |
| dc.type.csemresearchareas | PV & Solar Buildings |
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