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dc.contributor.authorHolovsky, J.
dc.contributor.authorDe Nicolas, S. M.
dc.contributor.authorDe Wolf, S.
dc.contributor.authorBallif, C.
dc.date.accessioned2021-12-13T16:35:46Z
dc.date.available2021-12-13T16:35:46Z
dc.date.issued2020-10
dc.identifier.citationAdvanced Materials Interfaces, vol. 7 (20), p. 7, Oct 2020.
dc.identifier.urihttps://yoda.csem.ch/handle/20.500.12839/408
dc.titleAmorphous/Crystalline Silicon Interface Stability: Correlation between Infrared Spectroscopy and Electronic Passivation Properties
dc.typeJournal Article
dc.type.csemdivisionsDiv-V
dc.type.csemresearchareasEnergy Harvesting
dc.type.csemresearchareasPV & Solar Buildings


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