Can automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testing

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Author
Auchlin, M.; Marozau, I.; Bayat, D. Z.; Marchand, L.; Gass, V.; Sereda, O.
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Publication Reference
Microelectronics Reliability, vol. 114, p. 7, Nov 2020.
Year
2020-01
URI
https://yoda.csem.ch/handle/20.500.12839/441
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