Can automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testing
| dc.contributor.author | Auchlin, M. | |
| dc.contributor.author | Marozau, I. | |
| dc.contributor.author | Bayat, D. Z. | |
| dc.contributor.author | Marchand, L. | |
| dc.contributor.author | Gass, V. | |
| dc.contributor.author | Sereda, O. | |
| dc.date.accessioned | 2021-12-13T16:36:10Z | |
| dc.date.available | 2021-12-13T16:36:10Z | |
| dc.date.issued | 2020-01 | |
| dc.identifier.citation | Microelectronics Reliability, vol. 114, p. 7, Nov 2020. | |
| dc.identifier.uri | https://yoda.csem.ch/handle/20.500.12839/441 | |
| dc.title | Can automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testing | |
| dc.type | Journal Article | |
| dc.type.csemdivisions | Div-T | |
| dc.type.csemresearchareas | MEMS & Packaging |
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