Can automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testing

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Author
Auchlin, M.
Marozau, I.
Bayat, D. Z.
Marchand, L.
Gass, V.
Sereda, O.
Abstract
Publication Reference
Microelectronics Reliability, vol. 114, p. 7, Nov 2020.
Year
2020-01
Sponsors