• Login
    View Item 
    •   YODA Home
    • CSEM Archive
    • Research Publications
    • View Item
    •   YODA Home
    • CSEM Archive
    • Research Publications
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    A 3-­DOF force measurement device for quality inspection applications of microsystems

    Thumbnail
    Author
    Glettig, Wayne; Droz, Serge; Longchamp, Quentin; Rabe, Rodolph; Breguet, Jean-Marc
    Metadata
    Show full item record
    Publication Reference
    EUSPEN, Leuven (Belgium)
    Year
    2015-01-06
    URI
    https://yoda.csem.ch/handle/20.500.12839/817
    Collections
    • Research Publications

    Browse

    All of YODACommunities & CollectionsBy Issue DateAuthorsTitlesResearch AreasBusiness UnitsThis CollectionBy Issue DateAuthorsTitlesResearch AreasBusiness Units

    My Account

    Login

    DSpace software copyright © 2002-2022  DuraSpace
    Contact Us | Send Feedback
    DSpace Express is a service operated by 
    Atmire NV