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Defect segmentation for multi-illumination quality control systems
Defect segmentation for multi-illumination quality control systems
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Author
Honzátko, D.
Türetken, E.
Bigdeli, S. A.
Dunbar, L. A.
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Abstract
Publication Reference
Machine Vision and Applications, vol. 32 (6), pp. 118
Year
2021-09
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URI
https://hdl.handle.net/20.500.12839/499
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