Defect segmentation for multi-illumination quality control systems

dc.contributor.authorHonzátko, D.
dc.contributor.authorTüretken, E.
dc.contributor.authorBigdeli, S. A.
dc.contributor.authorDunbar, L. A.
dc.date.accessioned2021-12-15T19:07:50Z
dc.date.available2021-12-15T19:07:50Z
dc.date.issued2021-09
dc.identifier.citationMachine Vision and Applications, vol. 32 (6), pp. 118
dc.identifier.urihttps://hdl.handle.net/20.500.12839/499
dc.titleDefect segmentation for multi-illumination quality control systems
dc.typeJournal Article
dc.type.csemdivisionsDiv-M
dc.type.csemresearchareasIoT & Vision
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