Properties of mixed phase silicon-oxide-based passivating contacts for silicon solar cells
| dc.contributor.author | Mack, I. | |
| dc.contributor.author | Stuckelberger, J. | |
| dc.contributor.author | Wyss, P. | |
| dc.contributor.author | Nogay, G. | |
| dc.contributor.author | Jeangros, Q. | |
| dc.contributor.author | Horzel, J. | |
| dc.contributor.author | et al. | |
| dc.date.accessioned | 2021-12-09T14:00:44Z | |
| dc.date.available | 2021-12-09T14:00:44Z | |
| dc.date.issued | 2018 | |
| dc.description.abstract | We investigate the properties of an electron selective front contact based on a phosphorous doped mixed-phase SiOx/Si layer stack at device level. The addition of the SiOx phase to the Si layer targets reduced optical absorption, pursuing the goal of a broad-band transparent full-area passivating contact for front-side application. To demonstrate the validity of our approach we realised a planar hybrid solar cell with the mixed-phase SiOx/Sibased passivating contact on the front side and a hydrogenated amorphous (i/p) silicon heterojunction as rear hole-selective contact. With this structure, we obtained a V-oc of 691 mV, a Jsc of 33.9 mA/cm(2), a fill factor of 79.4% and an efficiency of 18.6% on a planar n-type FZ Si-wafer. Temperature-dependent IV-measurements at solar cell level were performed in order to understand the physical mechanisms behind charge carrier transport and surface passivation of the mixed-phase SiOx/Si layer stack. The results were compared to those of a standard silicon heterojunction (SHJ) cell on a similar planar substrate. The temperature dependence of the IV-curves in the range from-100 degrees C to and75 degrees C reveals that the hybrid cell is less temperature sensitive with respect to the SHJ cell. Furthermore, at low temperatures, the analysis reveals a reduction of the voc temperature coefficient of the hybrid cell, whereas for the SHJ cell a saturation occurs. This behaviour hints that the barrier imposed by the SiOx/Si-based contact is less pronounced than the barrier imposed by a standard SHJ contact. | |
| dc.identifier.citation | Solar Energy Materials and Solar Cells, vol. 181, pp. 9-14, Jul 2018. | |
| dc.identifier.doi | https://doi.org/10.1016/j.solmat.2017.12.030 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.12839/254 | |
| dc.subject | Passivating contact, Silicon solar cells, Silicon oxide, Series, resistivity, Temperature dependence, temperature-dependence, resistance, layers, si, photovoltaics, performance, efficiency, voltage, Energy and Fuels, Materials Science, Physics | |
| dc.title | Properties of mixed phase silicon-oxide-based passivating contacts for silicon solar cells | |
| dc.type | Journal Article | |
| dc.type.csemdivisions | BU-V | |
| dc.type.csemresearchareas | Solar Cells and Modules |