In situ reflectometry and diffraction investigation of the multiscale structure of p-type polysilicon passivating contacts for c-si solar cells

Simple item page
dc.contributor.authorMorisset, A.
dc.contributor.authorFamprikis, T.
dc.contributor.authorHaug, F.-J.
dc.contributor.authorIngenito, A.
dc.contributor.authorBallif, C.
dc.contributor.authorBannenberg, L. J.
dc.date.accessioned2023-01-12T16:32:27Z
dc.date.available2023-01-12T16:32:27Z
dc.date.issued2022-03
dc.identifier.citationACS Applied Materials and Interfaces, 14(14), 16413-16423
dc.identifier.doidoi:10.1021/acsami.2c01225
dc.identifier.urihttps://hdl.handle.net/20.500.12839/1111
dc.titleIn situ reflectometry and diffraction investigation of the multiscale structure of p-type polysilicon passivating contacts for c-si solar cells
dc.typeJournal Article
dc.type.csemdivisionsBU-V
dc.type.csemresearchareasSolar Cells and Modules
Files
Collections
Research Publications