Advanced method for electrical characterization of carrier-selective passivating contacts using transfer-lengthmethod measurements under variable illumination
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Author
Geissbühler, J.
Allebé, C.
Badel, N.
Wyss, P.
DOI
https://doi.org/10.1063/5.0042854
Abstract
Publication Reference
Journal of Applied Physics, vol. 129 (19), 19570
Year
2021-04