Advanced method for electrical characterization of carrier-selective passivating contacts using transfer-lengthmethod measurements under variable illumination

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dc.contributor.authorGeissbühler, J.
dc.contributor.authorAllebé, C.
dc.contributor.authorBadel, N.
dc.contributor.authorWyss, P.
dc.date.accessioned2021-12-15T19:07:29Z
dc.date.available2021-12-15T19:07:29Z
dc.date.issued2021-04
dc.identifier.citationJournal of Applied Physics, vol. 129 (19), 19570
dc.identifier.doihttps://doi.org/10.1063/5.0042854
dc.identifier.urihttps://hdl.handle.net/20.500.12839/484
dc.titleAdvanced method for electrical characterization of carrier-selective passivating contacts using transfer-lengthmethod measurements under variable illumination
dc.typeJournal Article
dc.type.csemdivisionsBU-V
dc.type.csemresearchareasSolar Cells and Modules
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