Microlens testing on back-illuminated image sensors for space applications

dc.contributor.authorZanella, F.
dc.contributor.authorBasset, G.
dc.contributor.authorSchneider, C.
dc.contributor.authorLuu-Dinh, A.
dc.contributor.authorFricke, S.
dc.contributor.authorMadrigal, A. M.
dc.contributor.authoret al.
dc.date.accessioned2021-12-13T16:35:46Z
dc.date.available2021-12-13T16:35:46Z
dc.date.issued2020-04
dc.identifier.citationApplied Optics, vol. 59 (12), pp. 3636-3644, Apr 2020.
dc.identifier.urihttps://hdl.handle.net/20.500.12839/412
dc.titleMicrolens testing on back-illuminated image sensors for space applications
dc.typeJournal Article
dc.type.csemdivisionsDiv-R
dc.type.csemresearchareasMEMS & Packaging
dc.type.csemresearchareasPhotonics
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