Amorphous/Crystalline Silicon Interface Stability: Correlation between Infrared Spectroscopy and Electronic Passivation Properties

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Author
Holovsky, J.
De Nicolas, S. M.
De Wolf, S.
Ballif, C.
DOI
Abstract
Publication Reference
Advanced Materials Interfaces, vol. 7 (20), p. 7, Oct 2020.
Year
2020-10
Sponsors
URI
https://hdl.handle.net/20.500.12839/408
Collections
Research Publications