Can automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testing

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dc.contributor.authorAuchlin, M.
dc.contributor.authorMarozau, I.
dc.contributor.authorBayat, D. Z.
dc.contributor.authorMarchand, L.
dc.contributor.authorGass, V.
dc.contributor.authorSereda, O.
dc.date.accessioned2021-12-13T16:36:10Z
dc.date.available2021-12-13T16:36:10Z
dc.date.issued2020-01
dc.identifier.citationMicroelectronics Reliability, vol. 114, p. 7, Nov 2020.
dc.identifier.urihttps://hdl.handle.net/20.500.12839/441
dc.titleCan automotive MEMS be reliably used in space applications? An assessment method under sequential bi-parameter testing
dc.typeJournal Article
dc.type.csemdivisionsBU-T
dc.type.csemresearchareasMEMS & Packaging
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