Non-destructive MEMS atomic vapor cells characterization by Raman spectroscopy and image analysis
No Thumbnail Available
Author
Karlen, Sylvain
Gobet, Jean
Overstolz, Thomas
Haesler, Jacques
Abstract
The use of innovative and non-destructive methods to characterize the content of MEMS atomic vapor cells for atomic devices is reported: Raman spectroscopy is used as a fast and quantitative method to estimate the Nitrogen pressure inside the cell cavity and image analysis is used to quantify the amount of metallic Rubidium. These techniques can be used for buffer gas pressure optimization and cell lifetime assessment.
Publication Reference
2016 European Frequency and Time Forum (EFTF), York (United Kingdom), pp. 1-3
Year
2016-04