Non-destructive MEMS atomic vapor cells characterization by Raman spectroscopy and image analysis

dc.contributor.authorKarlen, Sylvain
dc.contributor.authorGobet, Jean
dc.contributor.authorOverstolz, Thomas
dc.contributor.authorHaesler, Jacques
dc.date.accessioned2022-02-14T17:08:01Z
dc.date.available2022-02-14T17:08:01Z
dc.date.issued2016-04
dc.description.abstractThe use of innovative and non-destructive methods to characterize the content of MEMS atomic vapor cells for atomic devices is reported: Raman spectroscopy is used as a fast and quantitative method to estimate the Nitrogen pressure inside the cell cavity and image analysis is used to quantify the amount of metallic Rubidium. These techniques can be used for buffer gas pressure optimization and cell lifetime assessment.
dc.identifier.citation2016 European Frequency and Time Forum (EFTF), York (United Kingdom), pp. 1-3
dc.identifier.doi10.1109/EFTF.2016.7477804
dc.identifier.urihttps://hdl.handle.net/20.500.12839/839
dc.titleNon-destructive MEMS atomic vapor cells characterization by Raman spectroscopy and image analysis
dc.typeProceedings Article
dc.type.csemdivisionsBU-I
dc.type.csemresearchareasScientific Instrumentation
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